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Author

Yizi Xing

Observed names: Y. Xing, Y. Z. XING, Y.Z. Xing, Yan Xing, Yaodong Xing, Yi-Zi Xing, Yongtao Xing
Institution: NXP (Netherlands)
ORCID: 0000-0003-4445-5261
Observed ORCID: 0000-0003-4445-5261
OpenAlex ID: A5113550789
Diagnosis of Local Spot Defects in Analog Circuits
2012 · Ke Huang, H. G. Stratigopoulos, et al. · IEEE Transactions on Instrumentation and Measurement · 58
Cost Effective Outliers Screening with Moving Limits and Correlation Testing for Analogue ICs
2006 · Liquan Fang, Mohammed Lemnawar, et al. · IEEE International Test Conference (ITC) · 43
Defect Oriented Testing for analog/mixed-signal devices
2011 · Bram Kruseman, Bratislav Tasic, et al. · IEEE International Test Conference (ITC) · 37
Defect-oriented testing of mixed-signal ICs: some industrial experience
2002 · Y. Xing · IEEE International Test Conference (ITC) · 35
Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example
2011 · H Hashempour, J Dohmen, et al. · Design, Automation, and Test in Europe · 27
Defect Oriented Testing for Analog/Mixed-Signal Designs
2012 · Bram Kruseman, Bratislav Tasic, et al. · IEEE Design & Test of Computers · 17
A new approach to offset reduction in sensors: the sensitivity-variation method
1984 · Yi-Zi Xing, S Kordic, et al. · Journal of Physics E Scientific Instruments · 13
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Practical implementation of defect-oriented testing for a mixed-signal class-D amplifier
2003 · R.H. Beurze, Y. Xing, et al. · IEEE European Test Symposium (ETS) · 12
A bubble-level tilt sensor with a large measurement range
1989 · Y.Z. Xing, F. Schneider · Sensors and Actuators · 11
The Search for Resilience Weak Spots in Automotive Mixed-Signal Circuits
2011 · Vincent Kerzerho, Hans G. Kerkhoff, et al. · IEEE International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW) · 4
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A new angular-position detector utilizing the lateral photoeffect in Si
1985 · Y.Z. Xing, C.P.W. Boeder · Sensors and Actuators · 4
Test pattern generation for delay faults
1991 · G. van Brakel, Yaodong Xing, et al. · University of Twente Research Information · 3
Design-for-Test of Digitally-Assisted Analog IPs for Automotive SoCs
2010 · Yizi Xing, Liquan Fang · Proceedings - Asian Test Symposium/Proceedings · 2
Accelerated fault simulation utilizing multiple-fault propagation
2003 · Y. Xing, G. van Brakel, et al. · Proceedings - Asian Test Symposium/Proceedings · 2
Efficient test pattern generation for delay faults
1992 · G. van Brakel, Yaodong Xing, et al. · University of Twente Research Information · 2
A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices
2011 · Nivesh Rai, Hamidreza Hashempour, et al. · Proceedings · 1
An electronic spirit level tilt sensor
1989 · Yizi Xing · Research Repository (Delft University of Technology) · 1
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Substrate and Defect Influences on the Position-response Linearity of Position-sensitive Detectors
1988 · Y. Z. XING · Le Journal de Physique Colloques · 1
Scan cell design for enhanced delay fault testability
2003 · G. van Brakel, Y. Xing, et al. · Annual IEEE International ASIC Conference and Exhibit
Detectability analysis and fault simulation for delay faults
1991 · Yan Xing, Hans G. Kerkhoff · University of Twente Research Information
Fault simulation for delay faults
1991 · Yan Xing, Hans G. Kerkhoff · University of Twente Research Information
A fast simulation technique for delay faults
1991 · Yongtao Xing, Hans G. Kerkhoff, et al. · University of Twente Research Information
Works count: 22
Citation count: 273
H-index: 9
I10-index: 9
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