Work

A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices

Year: 2011

Type: conference-paper

Source: Proceedings

DOI: 10.1109/dft.2011.21

Authors: Nivesh Rai, Hamidreza Hashempour, Yizi Xing, Bram Kruseman, Said Hamdioui

Institutions: Delft University of Technology, NXP (Netherlands)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2005686702

FWCI:

Cites: 16

Cited by: 1

Related to: 10