Work

Practical implementation of defect-oriented testing for a mixed-signal class-D amplifier

Year: 2003

Type: conference-paper

Abstract: This paper describes the flow of defect-oriented testing from beginning to end, based on the industrial test development for a commercial mixed-signal class-D amplifier. A software tool called DOTSS (Defect-Oriented Test Simulation System) was used to perform the fault simulations. The greatest benefit of using defect-oriented testing turns out to be that it gives more insight in the underlying fault mechanisms. This information can be used to generate complementary tests or to take design-for-testability measures to achieve a high fault coverage.

Source: IEEE European Test Symposium (ETS)

DOI: 10.1109/etw.1999.804205

Authors: R.H. Beurze, Y. Xing, R. van Kleef, R.J.W.T. Tangelder, N. Engin

Institution: University of Twente

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W2129444464

FWCI: 0.91

Cites: 19

Cited by: 12

Related to: 10