Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
V.K. Agarwal
Observed names:
V. Agarwal,
V. K. Agarwal,
V.K. AGARWAL,
VINOD K. AGARWAL,
Vinod Agarwal,
Vinod K. Agarwal
show all 6
Observed institutions:
Bell (Canada),
McGill University
OpenAlex ID:
A5114049709
A new procedure for weighted random built-in self-test
2002
·
F. Muradali
, V.K. Agarwal
, et al.
·
IEEE International Test Conference (ITC)
·
153
PDF
Serial interfacing for embedded-memory testing
1990
·
B. Nadeau-Dostie
, A. Silburt
, et al.
·
IEEE Design & Test of Computers
·
146
Testing and diagnosis of interconnects using boundary scan architecture
2003
·
A. Hassan
, J. Rajski
, et al.
·
IEEE International Test Conference (ITC)
·
141
Built-in self-diagnosis for repairable embedded RAMs
1993
·
R. Treuer
, V.K. Agarwal
·
IEEE Design & Test of Computers
·
83
Implementing a Built-In Self-Test PLA Design
1985
·
Robert Treuer
, Hideo Fujiwara
, et al.
·
IEEE Design & Test of Computers
·
82
BIST of PCB interconnects using boundary-scan architecture
1992
·
A.S.M. Hassan
, V.K. Agarwal
, et al.
·
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
·
68
A diagnosis method using pseudo-random vectors without intermediate signatures
2003
·
R.C. Aitken
, V.K. Agarwal
·
International Conference on Computer Aided Design
·
67
An iterative technique for calculating aliasing probability of linear feedback signature registers
2003
·
A. Ivanov
, V.K. Agarwal
·
IEEE International Symposium on Fault-Tolerant Computing
·
45
Distributed diagnosis algorithms for regular interconnected structures
1992
·
A.K. Somani
, V.K. Agarwal
·
IEEE Transactions on Computers
·
42
Soft-error filtering: A solution to the reliability problem of future VLSI digital circuits
1986
·
Y. Savaria
, N.C. Rumin
, et al.
·
Proceedings of the IEEE
·
37
Optimizing error masking in BIST by output data modification
1990
·
Yervant Zorian
, Vinod K. Agarwal
·
Journal of Electronic Testing
·
36
Almost sure diagnosis of almost every good element [logic testing]
1994
·
L.E. La Forge
, Kaiyuan Huang
, et al.
·
IEEE Transactions on Computers
·
31
A comparative study of multiprocessor list scheduling heuristics
1994
·
G. Liao
, E.R. Altman
, et al.
·
Hawaii International Conference on System Sciences (HICSS)
·
31
Diagnosis of clustered faults and wafer testing
1998
·
Kaiyuan Huang
, V.K. Agarwal
, et al.
·
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
·
27
An analysis of the probabilistic behavior of linear feedback signature registers
1989
·
A. Ivanov
, V.K. Agarwal
·
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
·
25
A reconfiguration scheme for yield enhancement of large area binary tree architectures
1988
·
M.C. Howells
, V.K. Agarwal
·
IEEE Transactions on Computers
·
23
Analysis of multithreaded multiprocessors with distributed shared memory
2002
·
S.S. Nemawarkar
, R. Givindarajan
, et al.
·
IEEE Symposium on Parallel and Distributed Processing (SPDP)
·
22
A diagnosis algorithm for constant degree structures and its application to VLSI circuit testing
1995
·
Kaiyuan Huang
, V.K. Agarwal
, et al.
·
IEEE Transactions on Parallel and Distributed Systems
·
22
Diagnosis of ${t / {(t + 1)}}$-Diagnosable Systems
1994
·
A. Das
, K. Thulasiraman
, et al.
·
SIAM Journal on Computing
·
21
Multiple fault testing of large circuits by single fault test sets
1981
·
V. Agarwal
, A. Fung
·
IEEE Transactions on Circuits and Systems
·
21
Testing of glue logic interconnects using boundary scan architecture
2003
·
A. Hassan
, V.K. Agarwal
, et al.
·
IEEE International Test Conference (ITC)
·
20
Multiprocessor fault diagnosis under local constraints
1993
·
A. Das
, K. Thulasiraman
, et al.
·
IEEE Transactions on Computers
·
20
Test generation for digital systems
1986
·
Jacob A. Abraham
, V.K. Agarwal
·
Prentice-Hall, Inc eBooks
·
20
Distributed syndrome decoding for regular interconnected structures
2003
·
A.K. Somani
, V.K. Agarwal
·
IEEE International Symposium on Fault-Tolerant Computing
·
18
Dynamic testability measures for ATPG
1988
·
A. Ivanov
, V.K. Agarwal
·
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
·
18
Show more works
View as search
Works count:
86
Citation count:
1,550
H-index:
20
I10-index:
39
Year
Topic
Type
