Built-in self-diagnosis for repairable embedded RAMs
Year: 1993
Type: article
Abstract: A method of built-in self-diagnosis (BISD) for repairable, embedded static RAMs (SRAMs) is presented. The BISD circuit, with self-repair, requires about 5% extra area in a 64-kb SRAM. The circuit contains a small reduced-instruction-set processor, which executes diagnosis algorithms stored in a ROM. These algorithms employ hybrid serial/parallel operations when external repair is available or modular operations when self-repair is required. The algorithms, hardware design, and design costs and tradeoffs are discussed.>
Source: IEEE Design & Test of Computers
DOI: 10.1109/54.211525
Authors: R. Treuer, V.K. Agarwal
Institution: McGill University
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W2164333395