Work

Dynamic testability measures for ATPG

Year: 1988

Type: article

Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI: 10.1109/43.3198

Authors: A. Ivanov, V.K. Agarwal

Institution: McGill University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2017109565

FWCI: 0.448

Cites: 24

Cited by: 18

Related to: 10