Work

Industrial Test Selection based on Test Time and Defect Coverage

Year: 1999

Type: conference-paper

Source: University of Twente Research Information

Authors: N. Engin, Hans G. Kerkhoff

Institution: University of Twente

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W158586138

FWCI:

Cites: 4

Cited by:

Related to: 10