Year: 1999
Type: article
Abstract: In order to enhance the lateral force sensitivity of atomic force microscopy (AFM) to detect atomic or molecular scale interaction, two types of force sensors were fabricated by additional processing of commercial sensors with the help of focused ion beam (FIB) technology. In one type of cantilever, a hinge was fabricated in the middle of the commercial cantilever by FIB milling, resulting in the reduction of the lateral force constant from 1204 N/m to 118 N/m. For further enhancement of the lateral sensitivity without causing snap-in behavior, a novel force sensor was designed and fabricated through a combination of FIB milling and FIB deposition techniques. The lateral force constant was reduced, for example, from 3600 N/m to 20 N/m, and the measured lateral force resolution attained the order of 1 nN.
DOI: 10.1143/jjap.38.3958
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W1995409337