Author

Masami Kageshima

Observed names: Kageshima Masami, M. Kageshima, Masami KAGESHIMA, Masami Kageshima Masami Kageshima

Institution: Osaka Electro-Communication University

Observed institutions: Kansai Medical University, Tokyo Gakugei University, Osaka Electro-Communication University, Japan Science and Technology Agency, National Institute of Advanced Industrial Science and Technology, The University of Tokyo, Tokyo University of Agriculture and Technology, The University of Osaka

ORCID: 0000-0002-9146-2096

Observed ORCID: 0000-0002-9146-2096

OpenAlex ID: A5024701451

Lithographing of Biomolecules on a Substrate Surface Using an Enzyme-Immobilized AFM Tip

2003 · Seiji Takeda, Chikashi Nakamura, et al. · Nano Letters · 58

Origin of p(2×1) Phase on Si(001) by Noncontact Atomic Force Microscopy at 5 K

2006 · Yan Jun Li, Hikaru Nomura, et al. · Physical Review Letters · 55

Nanorheology of Polymer Blends Investigated by Atomic Force Microscopy

1997 · Ken Nakajima Ken Nakajima, Hideki Yamaguchi Hideki Yamaguchi, et al. · Japanese Journal of Applied Physics · 54

Insight into conformational changes of a single α-helix peptide molecule through stiffness measurements

2001 · Masami Kageshima, Mark A. Lantz, et al. · Chemical Physics Letters · 41

Noncontact atomic force microscopy in liquid environment with quartz tuning fork and carbon nanotube probe

2002 · Masami Kageshima, Henriette Jensenius, et al. · Applied Surface Science · 39

Behavior of Charge Density Waves in a One-Dimensional Organic Conductor Visualized by Scanning Tunneling Microscopy

1998 · Tetsuya Nishiguchi, Masami Kageshima, et al. · Physical Review Letters · 33

Elimination of instabilities in phase shift curves in phase-modulation atomic force microscopy in constant-amplitude mode

2007 · Yasuhiro Sugawara, Naritaka Kobayashi, et al. · Applied Physics Letters · 30

Modified atomic force microscope applied to the measurement of elastic modulus for a single peptide molecule

2001 · Arkadiusz Ptak, Seiji Takeda, et al. · Journal of Applied Physics · 28

Reconstructions on the Si(113) surface

1996 · H. Sakama, D. Kunimatsu, et al. · Physical review. B, Condensed matter · 28

Simultaneous observation of surface topography and elasticity at atomic scale by multifrequency frequency modulation atomic force microscopy

2010 · Yoshitaka Naitoh, Zongmin Ma, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 26

The influence of a Si cantilever tip with/without tungsten coating on noncontact atomic force microscopy imaging of a Ge(001) surface

2009 · Yoshitaka Naitoh, Yukinori Kinoshita, et al. · Nanotechnology · 24

Multifrequency high-speed phase-modulation atomic force microscopy in liquids

2010 · Yan Jun Li, Kouhei Takahashi, et al. · Ultramicroscopy · 23

High-Sensitivity Force Detection by Phase-Modulation Atomic Force Microscopy

2006 · Naritaka Kobayashi, Yan Jun Li, et al. · Japanese Journal of Applied Physics · 22

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Study of Au-induced reconstruction on Si(001) surface by scanning tunneling microscopy and low energy electron diffraction

2001 · Masami Kageshima, Yuji Torii, et al. · Surface Science · 22

Atomic Force Microscopy Cantilevers for Sensitive Lateral Force Detection

1999 · Masami Kageshima, Hisato Ogiso, et al. · Japanese Journal of Applied Physics · 22

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Study of oxidized Cu(110) surface using noncontact atomic force microscopy

2008 · Shohei Kishimoto, Masami Kageshima, et al. · Surface Science · 21

Development of an ultrahigh vacuum atomic force microscope for investigations of semiconductor surfaces

1993 · M. Kageshima, H. Yamada, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 20

Development of atomic force microscope with wide-band magnetic excitation for study of soft matter dynamics

2009 · Masami Kageshima, Takuma Chikamoto, et al. · Review of Scientific Instruments · 18

Measurement of the Length of the .ALPHA. Helical Section of a Peptide Directly Using Atomic Force Microscopy.

2001 · Seiji TAKEDA, Arkadiusz PTAK, et al. · Chemical and Pharmaceutical Bulletin · 18

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Observation of Hydrogen-Terminated Silicon (111) Surface by Ultrahigh-Vacuum Atomic Force Microscopy

1993 · Masami Kageshima, Hirofumi Yamada, et al. · Japanese Journal of Applied Physics · 18

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Observation of thin film of one-dimensional organic conductor tetrathiofulvalene tetracyanoquinodimethane by means of atomic force microscopy

1993 · Ken Nakajima, Masami Kageshima, et al. · Applied Physics Letters · 17

High-Speed Phase-Modulation Atomic Force Microscopy in Constant-Amplitude Mode Capable of Simultaneous Measurement of Topography and Energy Dissipation

2008 · Yan Jun Li, Naritaka Kobayashi, et al. · Japanese Journal of Applied Physics · 15

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Layer-resolved relaxation dynamics of confined water analyzed through subnanometer shear measurement

2014 · Masami Kageshima · Europhysics Letters (EPL) · 14

Effect of Surface Stress around the S A Step of Si(001) on the Dimer Structure Determined by Noncontact Atomic Force Microscopy at 5 K

2009 · Yoshitaka Naitoh, Yan Jun Li, et al. · Journal of the Physical Society of Japan · 13

Wideband and hysteresis-free regulation of piezoelectric actuator based on induced current for high-speed scanning probe microscopy

2006 · Masami Kageshima, Shinsuke Togo, et al. · Review of Scientific Instruments · 12

Works count: 73

Citation count: 837

H-index: 18

I10-index: 33