Advanced channel engineering achieving aggressive reduction of VT variation for ultra-low-power applications
Year: 2011
Type: conference-paper
Authors: K. Fujita, Y. Torii, M. Hori, J. Oh, L. Shifren, P. Ranade, M. Nakagawa, K. Okabe, T. Miyake, K. Ohkoshi, M. Kuramae, T. Mori, T. Tsuruta, S. Thompson, T. Ema
Institutions: Fujitsu (Japan), Fujitsu Semiconductor (Japan)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2014010346