Work

The Patricia testability analysis tool

Year: 1991

Type: article

Source: Microprocessing and Microprogramming

DOI: 10.1016/0165-6074(91)90420-x

Authors: M. Hadjinicolaeu, N. Burgess, D. Sciuto, G. Buananno, P. Cavalloro, G. Zaza

Institutions: Brunel University of London, Politecnico di Milano, Italtel (Italy)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2051963771

FWCI:

Cites: 6

Cited by:

Related to: 10