Work

Fault coverage analysis for physically-based CMOS bridging faults at different power supply voltages

Year: 2002

Type: conference-paper

Source: IEEE International Test Conference (ITC)

DOI: 10.1109/test.1996.557136

Authors: Yuyun Liao, D.M.H. Walker

Institution: Texas A&M University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2115404539

FWCI: 2.809

Cites: 29

Cited by: 38

Related to: 10