Work

A statistical fault coverage metric for realistic path delay faults

Year: 2004

Type: conference-paper

Source: IEEE VLSI Test Symposium (VTS)

DOI: 10.1109/vtest.2004.1299223

Authors: Wangqi Qiu, Xiang Lu, Jing Wang, Zhuo Li, D.M.H. Walker, Weiping Shi

Institution: Texas A&M University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2126157463

FWCI: 1.606

Cites: 27

Cited by: 30

Related to: 10