Work

SOI charging prevention: chip-level net tracing and diode protection

Year: 2004

Type: conference-paper

Source: IEEE International Conference on IC Design and Technology (ICICDT)

DOI: 10.1109/icicdt.2004.1309926

Authors: T.B. Hook, H. Bonges, D. Harmon, Wing Lai

Institution: IBM (United States)

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2129664833

FWCI: 0.415

Cites:

Cited by: 6

Related to: 10