Gate-all-around Twin Silicon nanowire SONOS Memory
Year: 2007
Type: conference-paper
Source: Symposium on VLSI Technology
Authors: Sung Dae Suk, Kyoung Hwan Yeo, Keun Hwi Cho, Ming Li, Yun young Yeoh, Ki-Ha Hong, Sung-Han Kim, Young-Ho Koh, Sunggon Jung, WonJun Jang, Dong-Won Kim, Donggun Park, Byung-Il Ryu
Institutions: Samsung (South Korea), Samsung Electronics (South Korea)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2133908024