Work

Advanced Modeling and Accurate Characterization of a 16 Gb/s Memory Interface

Year: 2009

Type: article

Source: IEEE Transactions on Advanced Packaging

DOI: 10.1109/tadvp.2009.2018460

Authors: W.T. Beyene, C. Madden, Jung-Hoon Chun, Haechang Lee, Y. Frans, B. Leibowitz, Ken Chang, Namhoon Kim, Ting Wu, G. Yip, R. Perego

Institutions: Rambus (United States), Sungkyunkwan University, Xilinx (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: Swedish Foundation for International Cooperation in Research and Higher Education

OpenAlex ID: W2153175273

FWCI: 8.439

Cites: 51

Cited by: 25

Related to: 10