Work

Definite Observation of Interfacial Charge Transfer in Graphene Transistor by Using Soft X-ray 3D Scanning Photoelectron Microscopy

Year: 2012

Type: conference-paper

Source: International Conference on Solid State Devices and Materials (SSDM)

DOI: 10.7567/ssdm.2012.c-7-4

Authors: H. Fukidome, N. Nagamura, K. Horiba, S. Toyoda, S. Kurosumi, T. Shinohara, T. Ide, M. Suemitsu, K. Nagashio, A. Toriumi, M. Oshima

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2467247396

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