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A Machine Learning Based Approach to Detect False Calls in SMT Manufacturing

Year: 2020

Type: conference-paper

Source: International Spring Seminar on Electronics Technology

DOI: 10.1109/isse49702.2020.9121044

Authors: Nils Thielen, Dominik Werner, Konstantin Schmidt, Reinhardt Seidel, Andreas Reinhardt, Jorg Franke

Institution: Friedrich-Alexander-Universität Erlangen-Nürnberg

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3036183253

FWCI: 5.585

Cites: 9

Cited by: 25

Related to: 10