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Semiconductor Application Fail Root Causes And Secure Test Remedy

Year: 2024

Type: conference-paper

Source: IEEE European Test Symposium (ETS)

DOI: 10.1109/ets61313.2024.10567545

Authors: Heguo Yin, Peter Poechmueller

Institution: Shandong University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4400034056

FWCI: 0.225

Cites: 9

Cited by: 1

Related to: 10