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Author

Nur Engin

Observed names: Engin, N, Engin, N., N. Engin
Institution: NXP (Netherlands)
OpenAlex ID: A5015621274
SAND: a modular application development platform for miniature wireless sensors
2006 · M. Ouwerkerk, F. Pasveer, et al. · Wearable and Implantable Body Sensor Networks · 30
Multistandard FEC Decoders for Wireless Devices
2008 · J. Dielissen, Nur Engin, et al. · IEEE Transactions on Circuits & Systems II Express Briefs · 19
Scalable reconfigurable channel decoder architecture for future wireless handsets
2007 · Krishnaiah Gummidipudi, N. Engin, et al. · 12
Practical implementation of defect-oriented testing for a mixed-signal class-D amplifier
2003 · R.H. Beurze, Y. Xing, et al. · IEEE European Test Symposium (ETS) · 12
Scalable Reconfigurable Channel Decoder Architecture for Future Wireless Handsets
2007 · Gummidipudi Krishnaiah, Nur Engin, et al. · Design, Automation, and Test in Europe · 9
Linking Mixed-Signal Design and Test: Generation and Evaluation of Specification-Based Tests
2000 · Nur Engin · University of Twente Research Information · 9
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Fast fault simulation for nonlinear analog circuits
2003 · N. Engin, H.G. Kerkhoff · IEEE Design & Test of Computers · 8
Rapid prototyping of a DVB-SH turbo decoder using high-level-synthesis
2009 · Marko Rößler, Hailu Wang, et al. · Forum on specification and Design Languages · 5
MISMATCH: a basis for semi-automatic functional mixed-signal test-pattern generation
2002 · H. Kerkhoff, R. Tangelder, et al. · IEEE International Conference on Electronics, Circuits and Systems (ICECS) · 5
A turbo decoder architecture with scalable parallelism
2004 · Nur Engin · SiPS ... design and implementation - IEEE Workshop on Signal Processing Systems · 4
Viterbi decoding on a coprocessor architecture with vector parallelism
2004 · N. Engin, K. van Berkel · SiPS ... design and implementation - IEEE Workshop on Signal Processing Systems · 3
Selective clipping and filtering: A low-EVM PAPR reduction scheme for OFDM standards
2016 · Audrey Cuenin, Nur Engin · IEEE International Symposium on Personal, Indoor and Mobile Radio Communications (PIMRC) · 2
Viterbi Decoding on a Co-processor Architecture With Vector Parallelism
2003 · N. Engin, Kees van Berkel · TU/e Research Portal · 2
Leakage mitigation for low power microcontroller design in 40nm for Internet-of-Things (IoT)
2016 · Ajay Kapoor, Nur Engin, et al. · IEEE International On-Line Testing Symposium (IOLTS) · 1
Enabling Low Leakage SRAM Memories at system level: A case study
2016 · N. Engin, Ajay Kapoor · Publication Server of Kaiserslautern University of Technology (Kaiserslautern University of Technology) · 1
A New Analog Fault Simulation Method Based on DC-Bias Grouping
2000 · N. Engin, Hans G. Kerkhoff · University of Twente Research Information · 1
Integrated Design and Test of Mixed-Signal Circuits
1999 · Nur Engin, Hans G. Kerkhoff, et al. · Journal of Electronic Testing · 1
Built-In Dynamic Current Testing of an Operational Amplifier in a Sea of Gates Technology
1998 · R.J.W.T. Tangelder, N. Engin, et al. · University of Twente Research Information · 1
A Tool for Automatic Test Plan Generation for Mixed-Signal Circuits
1998 · N. Engin, Hans G. Kerkhoff, et al. · University of Twente Research Information · 1
Automatic test plan generation for mixed-signal circuits in an integrated design and test environment
1997 · N. Engin, Hans G. Kerkhoff, et al. · University of Twente Research Information · 1
Chapter 12 FEC Decoders for Future Wireless Devices: Scalability Issues and Multi-standard Capabilities
2009 · J. Dielissen, N. Engin, et al. · TU/e Research Portal
FEC Decoders for FutureWireless Devices: Scalability Issues and Multi-standard Capabilities
2009 · John Dielissen, Nur Engin, et al. · Integrated circuits and systems
A scalar/vector processor (priority date 24-05-2002/international filing date 22-05-2003/international publication date 09-03-2005)
2005 · C.H. van Berkel, P.P.E. Meuwissen, et al. · TU/e Research Portal
Reduction in Fault Simulation Time Using Latency
2000 · N. Engin, Hans G. Kerkhoff · University of Twente Research Information
Industrial Test Selection based on Test Time and Defect Coverage
1999 · N. Engin, Hans G. Kerkhoff · University of Twente Research Information
Works count: 38
Citation count: 127
H-index: 7
I10-index: 4
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