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A.K. Majhi
Observed names:
A. Majhi,
Arpita Majhi
Institution:
Utkal University
Observed institutions:
NXP (Netherlands),
Philips (Netherlands),
NXP (Germany),
Signify (Netherlands),
Indian Institute of Science Bangalore,
Utkal University
show all 6
ORCID:
0000-0002-9517-7911
Observed ORCID:
0000-0002-9517-7911
OpenAlex ID:
A5039616323
On hazard-free patterns for fine-delay fault testing
2005
·
B. Kruseman
, A.K. Majhi
, et al.
·
IEEE International Test Conference (ITC)
·
108
Systematic defects in deep sub-micron technologies
2005
·
B. Kruseman
, A. Majhi
, et al.
·
IEEE International Test Conference (ITC)
·
69
Line coverage of path delay faults
2000
·
A.K. Majhi
, V.D. Agrawak
, et al.
·
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
·
57
Delay fault models and coverage
2002
·
A.K. Majhi
, V.D. Agrawal
·
International Conference on VLSI Design
·
53
Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality
2008
·
S. Eichenberger
, J. Geuzebroek
, et al.
·
IEEE International Test Conference (ITC)
·
43
On test coverage of path delay faults
2002
·
A.K. Majhi
, J. Jacob
, et al.
·
International Conference on VLSI Design
·
34
Modeling Power Supply Noise in Delay Testing
2007
·
Jing Wang
, D.M. Walker
, et al.
·
IEEE Design & Test of Computers
·
28
Diagnosis of Full Open Defects in Interconnecting Lines
2007
·
R. Rodriguez-Montanes
, D. Arumi
, et al.
·
IEEE VLSI Test Symposium (VTS)
·
26
New test methodology for resistive open defect detection in memory address decoders
2004
·
M. Azimane
, A.K. Majhi
·
IEEE VLSI Test Symposium (VTS)
·
25
Memory Testing Under Different Stress Conditions: An Industrial Evaluation
2005
·
A.K. Majhi
, M. Azimane
, et al.
·
Design, Automation, and Test in Europe
·
14
PDF
An efficient automatic test generation system for path delay faults in combinational circuits
2002
·
A.K. Majhi
, J. Jacob
, et al.
·
International Conference on VLSI Design
·
14
Mixed-signal test
2002
·
A.K. Majhi
, V.D. Agrawal
·
International Conference on VLSI Design
·
13
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages
2007
·
D. Arumi
, R. Rodriguez-Montanes
, et al.
·
IEEE VLSI Test Symposium (VTS)
·
9
Automated AC (timing) characterization for digital circuit testing
2002
·
S. Balajee
, A.K. Majhi
·
International Conference on VLSI Design
·
7
A New Algorithm for Dynamic Faults Detection in RAMs
2005
·
M. Azimane
, A. Majhi
, et al.
·
IEEE VLSI Test Symposium (VTS)
·
6
Improving diagnostic resolution of delay faults using path delay fault model
2003
·
A.K. Majhi
, G. Gronthoud
, et al.
·
IEEE VLSI Test Symposium (VTS)
·
6
Machine Learning Approach for Land Use Land Cover Classification of Similipal Reserve Forest
2024
·
Arpita Majhi
, Mrutyunjaya Panda
, et al.
·
International Conference on Artificial Intelligence and Quantum Computing (AIQC)
·
1
Machine Learning Approach for Change Detection of Chandaka Wildlife Sanctuary with the Help of Remote Sensing Data
2022
·
Arpita Majhi
, Kabir Mohan Sethy
, et al.
·
Lecture notes in networks and systems
·
1
Memory testing improvements through different stress conditions
2005
·
A. Majhi
, M. Azimane
, et al.
·
European Solid-State Circuits Conference (ESSCIRC)
·
1
Change Detection of Chandaka Forest and Analysis of Remote Sensing Data Using Machine Learning and Geographic Information System
2026
·
Arpita Majhi
, Mrutyunjaya Panda
, et al.
·
ITEGAM- Journal of Engineering and Technology for Industrial Applications (ITEGAM-JETIA)
PDF
Application of GIS and Remote Sensing to Study the Change Detection in Similipal Reserve Forest using Machine Learning
2025
·
Arpita Majhi
·
Journal of Information Systems Engineering & Management
PDF
IP Session 1C: Highways to Zero-Defects: Industrial Approaches
2008
·
A.K. Majhi
·
IEEE VLSI Test Symposium (VTS)
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Works count:
22
Citation count:
515
H-index:
12
I10-index:
12
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