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Author

G. Crisenza

Observed names: G. CRISENZA, Giuseppe Crisenza
Observed institution: University of Milan
OpenAlex ID: A5065015440
Phase Change Memory: A New Memory Enables New Memory Usage Models
2009 · Sean Eilert, Mark Leinwander, et al. · IEEE International Memory Workshop (IMW) · 96
Multilevel flash cells and their trade-offs
2002 · B. Eitan, R. Kazerounian, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 60
Layout dependence of CMOS latchup
1988 · R. Menozzi, L. Selmi, et al. · IEEE Transactions on Electron Devices · 41
A novel method for the experimental determination of the coupling ratios in submicron EPROM and flash EEPROM cells
2002 · R. Bez, E. Camerlenghi, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 32
Manufacturability of Low Power CMOS Technology Solutions
1996 · A. J. Strojwas, M. Quarantelli, et al. · 24
Charge loss in EPROM due to ion generation and transport in interlevel dielectric
2002 · G. Crisenza, G. Ghidini, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 18
Manufacturability of low power CMOS technology solutions
2002 · A.J. Strojwas, M. Quarantelli, et al. · International Symposium on Low Power Electronics and Design (ISLPED) · 14
Floating gate memories reliability
1992 · G. Crisenza, C. Clementi, et al. · Quality and Reliability Engineering International · 14
Non Volatile Memories: Issues, Challenges and Trends for the 2000's Scenario
1996 · G. Crisenza, R. Annunziata, et al. · European Solid-State Device Research Conference · 5
High Voltage Switching P-channel Structure for Cmos Architectures
1988 · C. MORI, G. CRISENZA, et al. · Le Journal de Physique Colloques · 5
Hysteresis cycle in the latch-up characteristic of wide CMOS structures
1988 · L. Selmi, E. Sangiorgi, et al. · IEEE Electron Device Letters · 5
Non volatile memories-status and emerging trends
1991 · M. Melanotte, R. Bez, et al. · Microelectronic Engineering · 4
A 18 μm 2 cell for Megabit CMOS EPROM
1987 · E. Camerlenghi, P. Caprara, et al. · European Solid-State Device Research Conference · 2
Yield in flash memory: Methodology, modeling and design issues.
2003 · G. Crisenza · International Symposium on Quality Electronic Design (ISQED) · 1
A New Flash Architecture With a 5.83l2 Scalable Amg Flash Cell
1997 · Anirban Roy, Keza Kazerounian, et al.
Electrical and radiation tests of thin tunnel oxides
1996 · A. Paccagnella, A. Rizzato, et al. · Microelectronics Reliability
Works count: 16
Citation count: 321
H-index: 8
I10-index: 8
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