Get started
Author

Paul H. Eaton

Observed names: Eaton, P., P. Eaton, P. H. Eaton, P.H. Eaton, Paul Eaton
OpenAlex ID: A5066132956
Soft error rate mitigation techniques for modern microcircuits
2003 · D.G. Mavis, P.H. Eaton · IEEE International Reliability Physics Symposium proceedings · 372
Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies
2007 · Balaji Narasimham, Bharat L. Bhuva, et al. · IEEE Transactions on Nuclear Science · 173
Single event transient pulse widths in digital microcircuits
2004 · M.J. Gadlage, R.D. Schrimpf, et al. · IEEE Transactions on Nuclear Science · 154
Single-Event Transient Pulse Quenching in Advanced CMOS Logic Circuits
2009 · Jonathan R. Ahlbin, Lloyd W. Massengill, et al. · IEEE Transactions on Nuclear Science · 149
Digital Single Event Transient Trends With Technology Node Scaling
2006 · J. M. Benedetto, P. H. Eaton, et al. · IEEE Transactions on Nuclear Science · 148
Heavy ion-induced digital single-event transients in deep submicron Processes
2004 · J. Benedetto, P. Eaton, et al. · IEEE Transactions on Nuclear Science · 140
Single event transient pulsewidth measurements using a variable temporal latch technique
2004 · P. Eaton, J. Benedetto, et al. · IEEE Transactions on Nuclear Science · 132
SEU and SET Modeling and Mitigation in Deep Submicron Technologies
2007 · David G. Mavis, Paul H. Eaton · IEEE International Reliability Physics Symposium proceedings · 116
Variation of digital SET pulse widths and the implications for single event hardening of advanced CMOS processes
2005 · J.M. Benedetto, P.H. Eaton, et al. · IEEE Transactions on Nuclear Science · 74
Effects of Guard Bands and Well Contacts in Mitigating Long SETs in Advanced CMOS Processes
2008 · Balaji Narasimham, Bharat L. Bhuva, et al. · IEEE Transactions on Nuclear Science · 72
Neurocontroller alternatives for "fuzzy" ball-and-beam systems with nonuniform nonlinear friction
2000 · P.H. Eaton, D.V. Prokhorov, et al. · IEEE Transactions on Neural Networks · 67
Multiple Bit Upsets and Error Mitigation in Ultra-Deep Submicron SRAMS
2008 · D. G. Mavis, P. H. Eaton, et al. · IEEE Transactions on Nuclear Science · 63
Effect of Multiple-Transistor Charge Collection on Single-Event Transient Pulse Widths
2011 · Jonathan R. Ahlbin, Matthew J. Gadlage, et al. · IEEE Transactions on Device and Materials Reliability · 57
Comparison of heavy ion and proton induced combinatorial and sequential logic error rates in a deep submicron process
2005 · M.J. Gadlage, P.H. Eaton, et al. · IEEE Transactions on Nuclear Science · 42
Effect of Voltage Fluctuations on the Single Event Transient Response of Deep Submicron Digital Circuits
2007 · Matthew J. Gadlage, Ronald D. Schrimpf, et al. · IEEE Transactions on Nuclear Science · 36
Digital Device Error Rate Trends in Advanced CMOS Technologies
2006 · Matthew J. Gadlage, Paul H. Eaton, et al. · IEEE Transactions on Nuclear Science · 32
Investigation of Current Spike Phenomena during Heavy Ion Irradiation of NAND Flash Memories
2011 · Timothy R. Oldham, Melanie Berg, et al. · IEEE Radiation Effects Data Workshop (REDW) · 27
PDF
Implications of Total Dose on Single-Event Transient (SET) Pulse Width Measurement Techniques
2008 · A. Balasubramanian, B. Narasimham, et al. · IEEE Transactions on Nuclear Science · 12
Correlation of Laser Test Results With Heavy Ion Results for NAND Flash Memory
2012 · T. R. Oldham, M. R. Friendlich, et al. · IEEE Transactions on Nuclear Science · 11
Total Dose Effect on the Propagation of Single Event Transients in a CMOS Inverter String
2010 · Stephen Buchner, Michael Sibley, et al. · IEEE Transactions on Nuclear Science · 11
SEE characterization and mitigation in ultra-deep submicron technologies
2009 · David G. Mavis, Paul H. Eaton, et al. · IEEE International Conference on IC Design and Technology (ICICDT) · 11
Effect of multiple-transistor charge collection on SET pulse widths
2010 · J. R. Ahlbin, M. J. Gadlage, et al. · IEEE International Reliability Physics Symposium proceedings · 8
Modeling and verification of single event transients in deep submicron technologies
2004 · M.J. Gadlage, R.D. Schrimpf, et al. · IEEE International Reliability Physics Symposium proceedings · 7
Total dose evaluation of state-of-the-art commercial analog to digital converters for space-based imaging applications
2002 · J.D. Black, P.H. Eaton, et al. · IEEE Radiation Effects Data Workshop (REDW) · 7
An automated approach to isolate dominant SER susceptibilities in microcircuits
2011 · James Castillo, David Mavis, et al. · IEEE International Reliability Physics Symposium proceedings · 6
Works count: 33
Citation count: 1,941
H-index: 17
I10-index: 21
Year
Topic
Type