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Ramya Cuduvally

Performance Enhancement of Piezoelectric Energy Harvesters Using Multilayer and Multistep Beam Configurations
2015 · Rammohan Sriramdas, Sanketh Chiplunkar, et al. · IEEE Sensors Journal · 78
Toward accurate composition analysis of GaN and AlGaN using atom probe tomography
2018 · Richard. J. H. Morris, Ramya Cuduvally, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 36
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Atom probe of GaN/AlGaN heterostructures: The role of electric field, sample crystallography and laser excitation on quantification
2019 · Richard J.H. Morris, Ramya Cuduvally, et al. · Ultramicroscopy · 23
Two-Parameter Quasi-Ballistic Transport Model for Nanoscale Transistors
2019 · Ji Ung Lee, Ramya Cuduvally, et al. · Scientific Reports · 23
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Potential sources of compositional inaccuracy in the atom probe tomography of InxGa1-xAs
2019 · Ramya Cuduvally, Richard J.H. Morris, et al. · Ultramicroscopy · 15
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Field dependent study on the impact of co-evaporated multihits and ion pile-up for the apparent stoichiometric quantification of GaN and AlN
2022 · Richard J.H. Morris, Ramya Cuduvally, et al. · Ultramicroscopy · 13
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The impact of electric field strength on the accuracy of boron dopant quantification in silicon using atom probe tomography
2024 · Bavley Guerguis, Ramya Cuduvally, et al. · Ultramicroscopy · 11
Tunneling-triggered bipolar action in junctionless tunnel field-effect transistor
2014 · Suresh Gundapaneni, Aranya Goswami, et al. · Applied Physics Express · 9
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Post-field ionization of Si clusters in atom probe tomography: A joint theoretical and experimental study
2022 · Ramya Cuduvally, Richard J. H. Morris, et al. · Journal of Applied Physics · 8
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In Situ Focused Ion Beam Redeposition Surface Coatings for Site-Specific, Near-Surface Characterization by Atom Probe Tomography
2025 · Bavley Guerguis, Ramya Cuduvally, et al. · Microscopy and Microanalysis · 6
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A Correlative Study of Silicon Carbide Power Devices Using Atom Probe Tomography and Transmission Electron Microscopy
2023 · Ramya Cuduvally, Bavley Guerguis, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 2
Evaporation Dynamics of Boron Dopants in Silicon
2021 · Jonathan Op de Beeck, Christoph Freysoldt, et al. · Microscopy and Microanalysis · 2
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Opportunities and Challenges in APT Metrology for Semiconductor Applications
2019 · Claudia Fleischmann, Ramya Cuduvally, et al. · Microscopy and Microanalysis · 1
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Numerical Modelling of Laser Absorption and Heat Transport in Metallic-Overcoated APT Specimens
2026 · Bavley Guerguis, Bhaveshkumar Kamaliya, et al. · Ultramicroscopy
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A Coupled Electromagnetic-Thermal Transport Model for Laser-Tip Interactions in Atom Probe Tomography Specimens
2026 · Bavley Guerguis, Bhaveshkumar Kamaliya, et al. · Microscopy and Microanalysis
Erratum to "The impact of electric field strength on the accuracy of boron dopant quantification in silicon using atom probe tomography"
2025 · Bavley Guerguis, Ramya Cuduvally, et al. · Ultramicroscopy
Multi-Length-Scale Dopants Analysis of an Image Sensor via Focused Ion Beam-Secondary Ion Mass Spectrometry and Atom Probe Tomography
2025 · Guerguis, Bavley, Cuduvally, Ramya, et al. · arXiv (Cornell University)
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Improvement of Boron Dopant Quantification Accuracy in Atom Probe Tomography via High Electric Field Analysis
2024 · Bavley Guerguis, Ramya Cuduvally, et al. · Microscopy and Microanalysis
Publisher’s Note: “Tunneling-triggered bipolar action in junctionless tunnel field-effect transistor”
2014 · Suresh Gundapaneni, Aranya Goswami, et al. · Applied Physics Express
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Works count: 20
Citation count: 229
H-index: 8
I10-index: 7
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