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Derek K. Skinner
Observed names:
D K Skinner,
D. K. Skinner,
D.K. Skinner
Observed institutions:
University of Leicester,
Marconi Electronic Systems (United Kingdom),
GEC (United Kingdom),
European Space Research and Technology Centre
OpenAlex ID:
A5111778945
Secondary electron emission yield behaviour of polymers
1973
·
R.F. Willis
, D.K. Skinner
·
Solid State Communications
·
100
Carbon contamination of Si (111) surfaces
1969
·
J.M. Charig
, D.K. Skinner
·
Surface Science
·
47
The application of ion beam bevel sectioning and post‐sputter etch treatment in Auger crater‐edge profiling
1989
·
D. K. Skinner
·
Surface and Interface Analysis
·
29
Auger electron spectroscopy of nickel deposits on the silicon (111) surface
1970
·
J.M. Charig
, D.K. Skinner
·
Surface Science
·
26
Study of carbon-fiber surfaces using Auger and secondary electron emission spectroscopy
1972
·
R. F. Willis
, B. Fitton
, et al.
·
Journal of Applied Physics
·
20
New method of preparing (100) InP surfaces for schottky barrier and ohmic contact formation
1980
·
D. K. Skinner
·
Journal of Electronic Materials
·
19
Refinements to a Standard LEED-Auger System for the Analysis of Electron Emission at Low Primary Beam Energies
1972
·
D. K. Skinner
, R. F. Willis
·
Review of Scientific Instruments
·
18
Ion beam induced composition changes during auger sputter profiling of thin Al films on InP
1983
·
D. K. Skinner
, J. G. Swanson
, et al.
·
Surface and Interface Analysis
·
15
Correction of backscattering effects in the quantification of Auger depth profiles
1991
·
I. R. Barkshire
, M. Prutton
, et al.
·
Surface and Interface Analysis
·
13
Automatic and Interactive Correlation Partitioning Compared: Application to TiN/Ti/SiO2
1997
·
S. Haigh
, P. G. Kenny
, et al.
·
Surface and Interface Analysis
·
9
The Role of Auger Electron Spectroscopy in the Semiconductor Industry
1995
·
Derek K. Skinner
·
Microscopy Microanalysis Microstructures
·
7
PDF
3D characterization of a W/TiN/ Ti/Si contact structure using MULSAM
1998
·
R. H. Roberts
, M. Prutton
, et al.
·
Surface and Interface Analysis
·
5
Electron-beam effects during oxygen adsorption
1977
·
D Norman
, D K Skinner
·
Journal of Physics D Applied Physics
·
5
PDF
Probing for answers in the characterisation of advanced III–V device structures
1993
·
Derek K. Skinner
, Alan V. Hetherington
·
III-Vs Review
·
1
Auger Sputter Depth Profiling Applied to Advanced Semiconductor Device Structures
1985
·
D. K. Skinner
, C. Hill
, et al.
·
MRS Proceedings
·
1
Laser alloying of nickel gold germanium contacts to InP
2020
·
P J Topham
, D K Skinner
, et al.
·
CRC Press eBooks
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Works count:
16
Citation count:
315
H-index:
9
I10-index:
9
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