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M. Sbetti

Observed names: M Sbetti, M. SBETTI, Maurizio Sbetti, Sbetti, Maurizio
OpenAlex ID: A5039616036
Boron-interstitial silicon clusters and their effects on transient enhanced diffusion of boron in silicon
2000 · S. Solmi, M. Bersani, et al. · Journal of Applied Physics · 21
Homogeneous line width in a zinc borate glass activated by Eu3+
1997 · M. Sbetti, E. Moser, et al. · Journal of Non-Crystalline Solids · 19
Characterization of rapid thermal processing oxynitrides by SIMS and XPS analyses
1999 · M Bersani, L Vanzetti, et al. · Applied Surface Science · 10
XPS and SIMS depth profiling of oxynitrides
2000 · L. Vanzetti, M. Bersani, et al. · Surface and Interface Analysis · 9
ULSI technology and materials: Quantitative answers by combined mass spectrometry surface techniques
1998 · M. Bersani, M. Fedrizzi, et al. · International Conference on Characterization and Metrology for ULSI Technology · 8
Quantitative identification of laser cutting quality relying on visual information
2017 · Matteo Pacher, Lorenzo Monguzzi, et al. · Virtual Community of Pathological Anatomy (University of Castilla La Mancha) · 6
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Laser cutting of copper and brass alloys by high brilliance diode source with an extremely low BPP
2015 · Barbara Previtali, Giovanni Riva, et al. · International Congress on Applications of Lasers & Electro-Optics (ICALEO) · 4
The impact of the nitridation process on the properties of the Si–SiO2 interface
2001 · M.L. Polignano, M. Alessandri, et al. · Journal of Non-Crystalline Solids · 4
Characterization of nitrided silicon-silicon dioxide interfaces
1999 · M. L. Polignano, M. Alessandri, et al. · MRS Proceedings · 3
Sample holder implement for very small samples on SC-ultra SIMS instrument
2004 · M. Barozzi, D. Giubertoni, et al. · Applied Surface Science · 1
XPS and SIMS depth profiling of chlorine in high‐temperature oxynitrides
2002 · L. Vanzetti, M. Bersani, et al. · Surface and Interface Analysis · 1
Procedimento per una lavorazione laser
2019 · Matteo Pacher, Mara Tanelli, et al. · Virtual Community of Pathological Anatomy (University of Castilla La Mancha)
Chatacterization of nitrided silicon-silicon dioxide interfaces
2000 · M. L. POLIGNANO, M. ALESSANDRI, et al. · AIRUS
Ultrathin NO/N2O Oxynitride Dielectric For Advanced Flash Memory Application: Single Wafer and Batch Technology
1999 · R. Zonca, B. Crivelli, et al. · MRS Proceedings
Ultra-thin NO/N2O oxynitride dielectric for advanced flash memory applications: single wafer and batch technology
1999 · B. CRIVELLI, R. ZONCA, et al. · AIRUS
Works count: 16
Citation count: 86
H-index: 6
I10-index: 3
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