Author

Stephan Beckx

Observed name: S. Beckx
Institution: IMEC
OpenAlex ID: A5083115989
2004 · P. Dumon, W. Bogaerts, et al. · IEEE Photonics Technology Letters · 441
2006 · Wim Bogaerts, Pieter Dumon, et al. · IEEE Journal of Selected Topics in Quantum Electronics · 337
2002 · W. Bogaerts, V. Wiaux, et al. · IEEE Journal of Selected Topics in Quantum Electronics · 166
2004 · L. H. Frandsen, P. I. Borel, et al. · Optics Letters · 126
2007 · M.J.H. van Dal, N. Collaert, et al. · Symposium on VLSI Technology · 81
2006 · Pieter Dumon, Gino Priem, et al. · Japanese Journal of Applied Physics · 76
2005 · Guy Vereecke, Frank Holsteyns, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 49
2007 · G. Vellianitis, J. Petry, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 34
2004 · W. Bogaerts, P. Dumon, et al. · Photonics and Nanostructures - Fundamentals and Applications · 32
2006 · D. Shamiryan, M.R. Baklanov, et al. · Colloids and Surfaces A Physicochemical and Engineering Aspects · 29
2004 · B. Luyssaert, P. Vandersteegen, et al. · IEEE Photonics Technology Letters · 26
2003 · Wim Bogaerts, Vincent Wiaux, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 25
2005 · Wim Bogaerts, Pieter Dumon, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 21
2005 · P. Dumon, W. Bogaerts, et al. · International Workshop on Computational Electronics · 17
2005 · D. Taillaert, R. Baets, et al. · IEEE/LEOS Workshop on Fibres and Optical Passive Components (WFOPC) · 14
2007 · Shankar Kumar Selvaraja, Patrick Jaenen, et al. · IEEE Lasers and Electro-Optics Society Annual Meeting (LEOS) · 13
2005 · S. Beckx, M. Demand, et al. · Microelectronics Reliability · 13
2005 · K. Henson, R.J.P. Lander, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 12
2005 · N. Collaert, S. Brus, et al. · IEEE International Conference on IC Design and Technology (ICICDT) · 11
2007 · Denis Shamiryan, Vasile Paraschiv, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 10
2006 · J. de Vos, L. Haspeslagh, et al. · IEEE International Conference on IC Design and Technology (ICICDT) · 10
2006 · R. van Schaijk, M. van Duuren, et al. · IEEE International Memory Workshop (IMW) · 9
Works count: 55
Citation count: 1,664
H-index: 15
I10-index: 24
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