Author

Shigeo Sumita

Observed names: Shigeo SUMITA, Shigeo Sumita Shigeo Sumita

Observed institution: Kyushu University

OpenAlex ID: A5113551945

Dependence of the Grown-in Defect Distribution on Growth Rates in Czochralski Silicon

1993 · Shinsuke Sadamitsu, Shigeru Umeno, et al. · Japanese Journal of Applied Physics · 137

A Method of Quantitative Contamination with Metallic Impurities of the Surface of a Silicon Wafer

1988 · Masataka Hourai, Toshio Naridomi, et al. · Japanese Journal of Applied Physics · 114

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Influence of Metal Impurities on Leakage Current of Si N+P Diode

1991 · Morimasa Miyazaki, Masakazu Sano, et al. · Japanese Journal of Applied Physics · 39

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Axial Microscopic Distribution of Grown-in Defects in Czochralski-Grown Silicon Crystals

1993 · Shigeru Umeno, Shinsuke Sadamitsu, et al. · Japanese Journal of Applied Physics · 38

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Physical Properties and Structure of Binary Ferrite Melts

1983 · Shigeo Sumita, Kenji Morinaga, et al. · Transactions of the Japan Institute of Metals · 36

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Viscosity of Slag Melts Containing Fe2O3

1980 · Shigeo Sumita, Takashi Mimori, et al. · Journal of the Japan Institute of Metals and Materials · 32

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Transmission Electron Microscopy Observation of Defects Induced by Fe Contamination on Si(100) Surface

1991 · Shinsuke Sadamitsu, Ayako Sasaki, et al. · Japanese Journal of Applied Physics · 24

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The Optical Basicity and Fe2+–Fe3+ Redox in Oxyacid Salt Systems

1982 · Shigeo Sumita, Yoshiharu Matsumoto, et al. · Transactions of the Japan Institute of Metals · 23

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TEM Observation of Defects Induced by Cu Contamination on Si(100) Surface

1988 · Shinsuke Sadamitsu, Shigeo Sumita, et al. · Japanese Journal of Applied Physics · 22

Density and Surface Tension of Binary Ferrite Melts

1983 · Shigeo Sumita, Ken-ji Morinaga, et al. · Journal of the Japan Institute of Metals and Materials · 21

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Dependence of Gettering Efficiency on Metal Impurities

1989 · Morimasa Miyazaki, Masakazu Sano, et al. · Japanese Journal of Applied Physics · 17

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TEM Observation of Defects Induced by Ni Contamination on a Si(100) Surface

1989 · Shinsuke Sadamitsu, Masakazu Sano, et al. · Japanese Journal of Applied Physics · 15

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Determination of metallic impurities on the surface of silicon wafers.

1989 · Yasuko TANIZOE, Shigeo SUMITA, et al. · BUNSEKI KAGAKU · 14

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Ｎａ２Ｏ‐Ｆｅ２Ｏ３系，ＣａＯ‐Ｆｅ２Ｏ３系融体の物性

1982 · Shigeo SUMITA, Ken-ji MORINAGA, et al. · NIPPON KAGAKU KAISHI · 9

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Observation of Ring‐OSF Nuclei in CZ‐Si Using Short‐Time Annealing and Infrared Light Scattering Tomography

1995 · Kieran Marsden, Shinsuke Sadamitsu, et al. · Journal of The Electrochemical Society · 8

Electrical Conductivity and Viscosity of Binary Molten Ferrite Systems

1983 · Taiji Matano, Shigeo Sumita, et al. · Journal of the Japan Institute of Metals and Materials · 8

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Viscosity and Electrical Conductivity of Na2O-SiO2-ZnO and CaO-SiO2-ZnO Melts

1982 · Shigeo Sumita, Hironori Takano, et al. · Journal of the Japan Institute of Metals and Materials · 8

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Solubility of CO2 in Ferrite Slag Melts and It’s Effect on the Viscosity

1982 · Shigeo Sumita, Ken-ji Morinaga, et al. · Journal of the Japan Institute of Metals and Materials · 3

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Surface analysis of silicon wafer.

1989 · Nobukatsu FUJINO, Shigeo SUMITA · Hyomen Kagaku · 2

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Identification of defects induced by heavy metal contamination on Si(100) surface using TEM

1990 · Shinsuke Sadamitsu, Ayako Sasaki, et al. · Proceedings annual meeting Electron Microscopy Society of America

A Method of Quantitative Contamination with Metallic Impurities of the Surface of a Silicon Wafer : Semiconductors and Semiconductor Devices

1988 · Masataka Hourai, Toshio Naridomi, et al. · Japanese Journal of Applied Physics

TEM Observation of Defects Induced by Cu Contamination on Si(100) Surface : Condensed Matter

1988 · Shinsuke Sadamitsu, Shigeo Sumita, et al. · Japanese Journal of Applied Physics

Formation of Zinc-stannate (Zn2SnO4) from Solid Reaction of Stannic Oxide and Zinc Oxide

1984 · Shu-Ze HUANG, Shigeo SUMITA, et al. · Journal of the Mining and Metallurgical Institute of Japan

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Works count: 23

Citation count: 570

H-index: 13

I10-index: 13