2000 · Theodosia Gougousi, Yiheng Xu, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 18

Chemical Composition of AlN Thin Films Deposited at 523−723 K Using Dimethylethylamine Alane and Ammonia

1998 · J. N. Kidder,, H. K. Yun, et al. · Chemistry of Materials · 17

Bright visible photoluminescence in thin silicon films

1992 · T.P. Pearsall, Jeff C. Adams, et al. · Thin Solid Films · 15

Influence of gas composition on wafer temperature in a tungsten chemical vapor deposition reactor: Experimental measurements, model development, and parameter identification

2001 · Hsiao-Yung Chang, Raymond A. Adomaitis, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 11

Real-time acoustic sensing and control of metalorganic chemical vapor deposition precursor concentrations delivered from solid phase sources

2004 · L. Henn-Lecordier, J. N. Kidder, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 10

Real-time growth rate metrology for a tungsten chemical vapor deposition process by acoustic sensing

2001 · L. Henn-Lecordier, J. N. Kidder, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 8

Introduction to Light

1984 · Gary Waldman, John N. Kidder · American Journal of Physics · 8

Real-time, in situ film thickness metrology in a 10 Torr W chemical vapor deposition process using an acoustic sensor

2003 · L. Henn-Lecordier, J. N. Kidder, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 6

Diamondlike carbon films sputter deposited with an electron cyclotron resonance reactor

1992 · J. N. Kidder, W. J. Varhue · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 6

Thermal Conductivity of Single Carbon Fibers Using Photothermal Deflection Techniques

1993 · J. H. Barkyoumb, D. J. Land, et al. · MRS Proceedings · 4

Colors of the spectrum: Do you wonder where the yellow went?

1994 · John N. Kidder · Applied Optics · 2

Comment on ‘‘The Bezold–Brücke phenomenon and Goethe’s rejection of Newton’s O p t i c k s,’’ by Michael Duck [Am. J. Phys. 5 5, 793–796 (1987)]

1989 · John N. Kidder · American Journal of Physics · 2

AlN Films Deposited by LP-MOCVD Atomic Layer Deposition at Lower Temperatures Using DMEAA and Ammonia

1995 · J.N. Kidder, J. S. Kuo, et al. · MRS Proceedings · 1

Light and Color

1984 · R. Daniel Overheim, David L. Wagner, et al. · American Journal of Physics · 1

Use of Neon Exchange Gas for Precooling 3He Cryostats

1967 · John N. Kidder · Review of Scientific Instruments · 1

Real-Time Growth Rate Metrology for a Tungsten CVD Process by Acoustic Sensing

2000 · Laurent Henn‐Lecordier, John N. Kidder, et al. · University Libraries (University of Maryland)

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Influence of Gas Composition on Wafer Temperature Control in a Tungsten Chemical Vapor Deposition Reactor

2000 · Hsiao-Yung Chang, Raymond A. Adomaitis, et al. · University Libraries (University of Maryland)

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Works count: 32

Citation count: 427

H-index: 11

I10-index: 13