GaN HEMT thermal behavior and implications for reliability testing and analysis
Year: 2008
Type: article
Authors: Daniel S. Green, Bharath Vembu, David Hepper, Shawn R. Gibb, Daniel Jin, Rama Vetury, Jeffrey B. Shealy, L. Thomas Beechem, Samuel Graham
Institution: Georgia Institute of Technology
Language: English
Subfield: Condensed Matter Physics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
Funder: Air Force Research Laboratory
OpenAlex ID: W2001363775