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The application of CPL reticle technology for the 0.045-mm node

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Year: 2004
Type: conference-paper
Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
DOI: 10.1117/12.537613
Authors: Will Conley, Douglas J. Van Den Broeke, Robert J. Socha, Wei Wu, Lloyd C. Litt, Kevin D. Lucas, Bernard J. Roman, Richard D. Peters, Colita Parker, Fung Chen, Kurt E. Wampler, Thomas L. Laidig, Erika Schaefer, Jan-Pieter Kuijten, Arjan Verhappen, Stephan van de Goor, Martin Chaplin, Bryan S. Kasprowicz, Christopher J. Progler, Emilien Robert, Philippe Thony
Institutions: Motorola (United States), ASML (United States), ASML (Netherlands), Photronics (United States), STMicroelectronics (France)
Language: English

Topic: Advancements in Photolithography Techniques
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
SDG: Industry, innovation and infrastructure

Open Access status: closed
OpenAlex ID: W2013331817
FWCI: 0.415
Cites:
Cited by: 1
Related to: 10
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