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Material Stack Design With High Tolerance to Process-Induced Damage in Domain Wall Motion Device

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Year: 2014
Type: article
Source: IEEE Transactions on Magnetics
DOI: 10.1109/tmag.2014.2325019
Authors: Hiroaki Honjo, Shunsuke Fukami, Kunihiko Ishihara, Keizo Kinoshita, Yukihide Tsuji, Ayuka Morioka, Ryusuke Nebashi, Keiichi Tokutome, Noboru Sakimura, Michio Murahata, Sadahiko Miura, Tadahiko Sugibayashi, Naoki Kasai, Hideo Ohno
Institutions: NEC (Japan), Tohoku University, Research Institute of Electrical Communication, Tohoku University, Advanced Institute for Materials Research, Tohoku University
Language: English

Topic: Magnetic properties of thin films
Subfield: Condensed Matter Physics
Field: Physics and Astronomy
Domain: Physical Sciences

Open Access status: closed

Funder: Japan Society for the Promotion of Science
OpenAlex ID: W2320005811
FWCI: 0.482
Cites: 12
Cited by: 7
Related to: 10
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