Author

Thomas Krivec

Observed name: T. Krivec
ORCID: 0009-0006-8698-3416
Observed ORCID: 0009-0006-8698-3416
OpenAlex ID: A5036487496
2016 · E. Grünwald, R. Hammer, et al. · NDT & E International · 23
2018 · Qi Tao, Gerald Pinter, et al. · Journal of Applied Polymer Science · 21
2017 · Qi Tao, Gerald Pinter, et al. · Microelectronics Reliability · 12
2019 · M. Frewein, T. Krivec, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 11
2019 · Karsten Schischke, Dionysios Manessis, et al. · European Microelectronics and Packaging Conference · 10
2016 · Mario Gschwandl, Peter Fuchs, et al. · IEEE Electronics Packaging Technology Conference (EPTC) · 10
2023 · Claus O.W. Trost, Stanislav Žák, et al. · Composites Part B Engineering · 9
2020 · J. Zundel, T. Krivec, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 9
2014 · Katerina Macurova, Paul Angerer, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 9
2022 · M. Frewein, S. Stojanovic, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 8
2015 · K. Macurova, R. Bermejo, et al. · Journal of Microelectronics and Electronic Packaging · 8
2022 · Claus O.W. Trost, Martin Krobath, et al. · Materials & Design · 7
2023 · M. Weninger, J. Zündel, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 6
2019 · Mario Gschwandl, Peter Filipp Fuchs, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 6
2017 · D. Manessis, J. Pawlikowski, et al. · European Microelectronics and Packaging Conference · 6
2025 · Chongnan Peng, Johannes Macher, et al. · The International Journal of Advanced Manufacturing Technology · 5
2025 · Qiulin Yu, Chinmay Nawghane, et al. · Microelectronics Reliability · 5
2021 · J. Zundel, M. Sagerer, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 5
2015 · K. Macurova, P. Angerer, et al. · Materials Today Proceedings · 5
2013 · K. Macurova, A. Kharicha, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 5
2024 · Qiulin Yu, Vikram G. Kamble, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 3
2023 · Qi Tao, Thomas Krivec, et al. · Macromolecular Theory and Simulations · 3
Works count: 47
Citation count: 301
H-index: 9
I10-index: 8
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