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Haralampos‐G. Stratigopoulos

Observed names: H. G. Stratigopoulos, H. Stratigopoulos, H.-G. Stratigopoulos, H.-G.D. Stratigopoulos, H.G. Stratigopoulos, Haralampos G. Stratigopoulos, Haralampos Stratigopoulos, Haralampos-G Stratigopoulos, Haralampos-G. D. Stratigopoulos, Haralampos-G. Stratigopoulos, Haralampos-G.D. Stratigopoulos, Haralampos-S. Stratigopoulos, Haralampos-g. Stratigopoulos, Haralampos-g. Stratigopoulos Petros Drineas, Stratigopoulos Haralampos-G., Stratigopoulos, H., Stratigopoulos, Haralampos, Stratigopoulos, Haralampos-G, Stratigopoulos, Haralampos-G.
Observed institutions: Institut polytechnique de Grenoble, Centre National de la Recherche Scientifique, Université Joseph Fourier, Yale University, Sorbonne Université, Techniques of Informatics and Microelectronics for Integrated Systems Architecture, Instituto de Microelectrónica de Sevilla, STMicroelectronics (France), Institut Montpelliérain Alexander Grothendieck, LIP6, Université Pierre-et-Marie-Curie, Centro de Investigación y de Estudios Avanzados del Instituto Politécnico Nacional, Universidad de Sevilla, Université Grenoble Alpes
ORCID: 0000-0002-9943-5607
Observed ORCID: 0000-0002-9943-5607
OpenAlex ID: A5091734149
Error Moderation in Low-Cost Machine-Learning-Based Analog/RF Testing
2008 · H.-G. Stratigopoulos, Y. Makris · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 136
Machine learning applications in IC testing
2018 · Haralampos-G. Stratigopoulos · IEEE European Test Symposium (ETS) · 94
Testability and Dependability of AI Hardware: Survey, Trends, Challenges, and Perspectives
2023 · Fei Su, Chunsheng Liu, et al. · IEEE Design and Test · 88
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Defect Filter for Alternate RF Test
2009 · Haralampos-G. Stratigopoulos, Salvador Mir, et al. · IEEE European Test Symposium (ETS) · 76
Non-RF to RF Test Correlation Using Learning Machines: A Case Study
2007 · Haralampos-G.D. Stratigopoulos, Petros Drineas, et al. · IEEE VLSI Test Symposium (VTS) · 68
Nonlinear decision boundaries for testing analog circuits
2005 · H.-G.D. Stratigopoulos, Y. Makris · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 65
Evaluation of Analog/RF Test Measurements at the Design Stage
2009 · H.-G. Stratigopoulos, S. Mir, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 61
RF Specification Test Compaction Using Learning Machines
2009 · Haralampos-G. Stratigopoulos, Petros Drineas, et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 60
Diagnosis of Local Spot Defects in Analog Circuits
2012 · Ke Huang, H. G. Stratigopoulos, et al. · IEEE Transactions on Instrumentation and Measurement · 58
Fault diagnosis of analog circuits based on machine learning
2010 · Ke Huang, Haralampos-G Stratigopoulos, et al. · Design, Automation, and Test in Europe · 58
One-Shot Non-Intrusive Calibration Against Process Variations for Analog/RF Circuits
2016 · Martin Andraud, Haralampos-G. Stratigopoulos, et al. · IEEE Transactions on Circuits and Systems I Regular Papers · 57
Adaptive Alternate Analog Test
2012 · Haralampos-G. Stratigopoulos, Salvador Mir · IEEE Design & Test of Computers · 55
Neuron Fault Tolerance in Spiking Neural Networks
2021 · Theofilos Spyrou, Sarah A. El-Sayed, et al. · Design, Automation, and Test in Europe · 52
SymBIST: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety
2021 · Antonios Pavlidis, Marie-Minerve Louerat, et al. · IEEE Transactions on Circuits and Systems I Regular Papers · 51
Sensors for built-in alternate RF test
2010 · Louay Abdallah, Haralampos-G. Stratigopoulos, et al. · IEEE European Test Symposium (ETS) · 50
MixLock: Securing Mixed-Signal Circuits via Logic Locking
2019 · Julian Leonhard, Muhammad Yasin, et al. · Design, Automation, and Test in Europe · 41
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Experiences with non-intrusive sensors for RF built-in test
2012 · Louay Abdallah, Haralampos-G. Stratigopoulos, et al. · IEEE International Test Conference (ITC) · 40
Analog neural network design for RF built-in self-test
2010 · Dzmitry Maliuk, Haralampos-G. Stratigopoulos, et al. · IEEE International Test Conference (ITC) · 40
Defect-oriented non-intrusive RF test using on-chip temperature sensors
2013 · L. Abdallah, H. Stratigopoulos, et al. · IEEE VLSI Test Symposium (VTS) · 39
Enrichment of limited training sets in machine-learning-based analog/RF test
2009 · H.-G. Stratigopoulos, S. Mir, et al. · Design, Automation, and Test in Europe · 38
Fast Monte Carlo-Based Estimation of Analog Parametric Test Metrics
2014 · Haralampos-G. Stratigopoulos, Stephen Sunter · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 36
Adaptive Test With Test Escape Estimation for Mixed-Signal ICs
2017 · Haralampos-G. Stratigopoulos, Christian Streitwieser · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 33
Concurrent detection of erroneous responses in linear analog circuits
2006 · H.-G.D. Stratigopoulos, Y. Makris · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 32
Digital-to-Analog Hardware Trojan Attacks
2021 · Mohamed Elshamy, Giorgio Di Natale, et al. · IEEE Transactions on Circuits and Systems I Regular Papers · 31
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Estimation of Analog Parametric Test Metrics Using Copulas
2011 · Ahcène Bounceur, Salvador Mir, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 31
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Works count: 196
Citation count: 2,417
H-index: 28
I10-index: 68
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