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J. Yang
Observed names:
J W Yang,
J Yang,
J. W. Yang,
J. YANG,
J.-W. YANG,
J.W. Yang,
Joonghwan Yang
show all 7
Institution:
LG (South Korea)
Observed institutions:
Centre National de la Recherche Scientifique,
University of South Carolina,
LG (South Korea),
TRW (United States),
Jeonbuk National University
ORCID:
0000-0002-0680-9105
Observed ORCID:
0000-0002-0680-9105
OpenAlex ID:
A5016567418
AlGaN/GaN metal oxide semiconductor heterostructure field effect transistor
2000
·
M.A. Khan
, X. Hu
, et al.
·
IEEE Electron Device Letters
·
383
AlGaN/GaN metal–oxide–semiconductor heterostructure field-effect transistors on SiC substrates
2000
·
M. Asif Khan
, X. Hu
, et al.
·
Applied Physics Letters
·
360
Self-heating in high-power AlGaN-GaN HFETs
1998
·
R. Gaska
, A. Osinsky
, et al.
·
IEEE Electron Device Letters
·
306
AlGaN/GaN HEMTs on SiC with f/sub T/ of over 120 GHz
2002
·
V. Kumar
, W. Lu
, et al.
·
IEEE Electron Device Letters
·
229
Electron transport in AlGaN–GaN heterostructures grown on 6H–SiC substrates
1998
·
R. Gaska
, J. W. Yang
, et al.
·
Applied Physics Letters
·
218
Enhancement mode AlGaN/GaN HFET with selectivelygrown pn junction gate
2000
·
X. Hu
, G. Simin
, et al.
·
Electronics Letters
·
196
Enhancement and depletion mode GaN/AlGaN heterostructure field effect transistors
1996
·
M. Asif Khan
, Q. Chen
, et al.
·
Applied Physics Letters
·
187
High-power 10-GHz operation of AlGaN HFET's on insulating SiC
1998
·
G.J. Sullivan
, M.Y. Chen
, et al.
·
IEEE Electron Device Letters
·
121
SiO 2 -passivated lateral-geometry GaN transparent Schottky-barrier detectors
2000
·
V. Adivarahan
, G. Simin
, et al.
·
Applied Physics Letters
·
108
High quality GaN–InGaN heterostructures grown on (111) silicon substrates
1996
·
J. W. Yang
, C. J. Sun
, et al.
·
Applied Physics Letters
·
104
GaN–AlGaN heterostructure field-effect transistors over bulk GaN substrates
2000
·
M. Asif Khan
, J. W. Yang
, et al.
·
Applied Physics Letters
·
103
Thermal management of AlGaN-GaN HFETs on sapphire using flip-chip bonding with epoxy underfill
2003
·
Jie Sun
, H. Fatima
, et al.
·
IEEE Electron Device Letters
·
101
Mechanism of radio-frequency current collapse in GaN–AlGaN field-effect transistors
2001
·
A. Tarakji
, G. Simin
, et al.
·
Applied Physics Letters
·
93
Submicron gate Si3N4/AlGaN/GaN-metal-insulator-semiconductor heterostructure field-effect transistors
2003
·
V. Adivarahan
, M. Gaevski
, et al.
·
IEEE Electron Device Letters
·
85
Simulation of hot electron and quantum effects in AlGaN/GaN heterostructure field effect transistors
2004
·
N. Braga
, R. Mickevicius
, et al.
·
Journal of Applied Physics
·
81
Stable CW operation of field-plated GaN-AlGaN MOSHFETs at 19 W/mm
2005
·
V. Adivarahan
, J. Yang
, et al.
·
IEEE Electron Device Letters
·
76
Low-loss high power RF switching using multifinger AlGaN/GaN MOSHFETs
2002
·
A. Koudymov
, Xuhong Hu
, et al.
·
IEEE Electron Device Letters
·
71
Low-frequency noise in Al0.4Ga0.6N-based Schottky barrier photodetectors
2001
·
S. L. Rumyantsev
, N. Pala
, et al.
·
Applied Physics Letters
·
66
Piezoeffect and gate current in AlGaN/GaN high electron mobility transistors
1997
·
R. Gaska
, J. W. Yang
, et al.
·
Applied Physics Letters
·
60
Highly doped thin-channel GaN-metal–semiconductor field-effect transistors
2001
·
R. Gaska
, M. S. Shur
, et al.
·
Applied Physics Letters
·
50
Piezoelectric doping in AlInGaN/GaN heterostructures
1999
·
M. Asif Khan
, J. W. Yang
, et al.
·
Applied Physics Letters
·
48
High performance 0.25 μm gate-length AlGaN/GaN HEMTs on sapphire with power density of over 4.5 W/mm at 20 GHz
2003
·
V. Kumar
, A. Kuliev
, et al.
·
Solid-State Electronics
·
41
GaN-based light-emitting diode with textured indium tin oxide transparent layer coated with Al2O3 powder
2009
·
T. K. Kim
, S. H. Kim
, et al.
·
Applied Physics Letters
·
36
DC and microwave performance of a GaN/AlGaN MOSHFET under high temperature stress
2002
·
A Tarakji
, X Hu
, et al.
·
Solid-State Electronics
·
35
High-power RF switching using III-nitride metal-oxide-semiconductor heterojunction capacitors
2005
·
G. Simin
, A. Koudymov
, et al.
·
IEEE Electron Device Letters
·
32
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Works count:
61
Citation count:
3,614
H-index:
29
I10-index:
42
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