Author

Michael Banasch

Observed name: M. Banasch
Observed institution: Vistec Electron Beam (Germany)
OpenAlex ID: A5085081616
2023 · Uwe D. Zeitner, Michael Banasch, et al. · Journal of Micro/Nanopatterning Materials and Metrology · 23
2012 · E.-Bernhard Kley, Holger Schmidt, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 21
2017 · Martin Heusinger, Michael Banasch, et al. · Optics Express · 20
2022 · Mathias Hädrich, Thomas Siefke, et al. · PhotonicsViews · 14
2014 · Uwe Huebner, Matthias Falkner, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 14
2016 · Martin Heusinger, Michael Banasch, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8
2014 · Uwe D. Zeitner, Torsten Harzendorf, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
2023 · Uwe D. Zeitner, Michael Banasch, et al. · SPIE Novel Patterning Technologies · 2
2016 · T. Weichelt, Y. Bourgin, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
2014 · Torsten Harzendorf, Frank Fuchs, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
2018 · Martin Heusinger, Michael Banasch, et al. · Optical Fabrication, Testing, and Metrology
2017 · Martin Heusinger, Michael Banasch, et al. · Common Library Network (Der Gemeinsame Bibliotheksverbund)
2016 · Tina Weichelt, Yannick Bourgin, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
2012 · M. Krueger, M. Banasch, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Works count: 15
Citation count: 113
H-index: 7
I10-index: 5
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