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Chien-Jen Huang
Observed names:
Chien-Jen E. Huang,
Chien-Jen Eros Huang,
ChienJen Huang -
Institution:
KLA (United States)
Observed institutions:
Aletheia University,
National Chi Nan University,
National Tsing Hua University,
United Microelectronics (Taiwan),
KLA (United States)
OpenAlex ID:
A5110100304
Using multi-stage data mining technique to build forecast model for Taiwan stocks
2011
·
Chien-Jen Huang
, Peng-Wen Chen
, et al.
·
Neural Computing and Applications
·
31
Poly-Si TFTs With Three-Dimensional Finlike Channels Fabricated Using Nanoimprint Technology
2011
·
Henry J. H. Chen
, Jia-Rong Jhang
, et al.
·
IEEE Electron Device Letters
·
17
Using Genetic Algorithm Optimization SVM to Construction of Investment Model
2011
·
ChienJen Huang -
·
International Journal of Digital Content Technology and its Applications
·
13
High order correction and sampling strategy for 45nm immersion lithography overlay control
2008
·
Bo Yun Hsueh
, George K. C. Huang
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
13
Exploring Cognitive Difference in instructional outcomes using Text mining technology
2006
·
Chien-Jen Huang
, Ping-Heng Tsai
, et al.
·
Conference proceedings/Conference proceedings - IEEE International Conference on Systems, Man, and Cybernetics
·
13
Fast and accurate scatterometry metrology method for STI CMP step height process evaluation
2012
·
Chih-Hsun Lin
, Climbing Huang
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
12
Study on Characteristics of Poly-Si TFTs With 3-D Finlike Channels Fabricated by Nanoimprint Technology
2012
·
Henry J. H. Chen
, Jia-Rong Jhang
, et al.
·
IEEE Transactions on Electron Devices
·
9
Apply multiple target for advanced gate ADI critical dimension measurement by scatterometry technology
2012
·
Wei-Jhe Tzai
, Howard Chen
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
8
Overlay control strategy for 45/32nm RD and production ramp up
2010
·
Tuan-Yen Yu
, Jun-Hung Lin
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
5
Lithography process controllers and photoresist monitoring by signal response metrology (SRM)
2015
·
He Rong Yang
, Tang Chun Weng
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
4
Sampling strategy: optimization and correction for high-order overlay control for 45nm process node
2009
·
Bo Yun Hsueh
, George K. C. Huang
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
3
Metrology of advanced N14 process pattern split at lithography
2014
·
Wei-Jhe Tzai
, Chia-Ching Lin
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
2
Advanced Spectroscopic Ellipsometry Application for Multi-Layers SiGe at 28nm Node and Beyond
2013
·
Teng-Chun Hsuan
, Yi-Cheng Hu
, et al.
·
ECS Transactions
·
2
PDF
Nonvolatile Polycrystalline-Silicon Thin-Film-Transistor Silicon–Oxide–Nitride–Oxide–Silicon Memory with Periodical Finlike Channels Fabricated Using Nanoimprint Technology
2013
·
Henry J. H. Chen
, Chien-Jen Huang
·
Applied Physics Express
·
2
Associating grey relation and cluster analysis to perform financial characteristic study on enterprises in China
2011
·
Chien-Jen Huang
, Mei Albert Kuo-Chung
·
Journal of Information and Optimization Sciences
·
2
A high performance low complexity joint transceiver for closed-loop MIMO applications
2010
·
Jian-Lung Tzeng
, Chien-Jen Huang
, et al.
·
Asia and South Pacific Design Automation Conference (ASP-DAC)
·
2
Social chance discovery
2009
·
Chao-Fu Hong
, Chien-Jen Huang
, et al.
·
Conference proceedings/Conference proceedings - IEEE International Conference on Systems, Man, and Cybernetics
·
2
45-nm design rule in-die overlay metrology on immersion lithography processes
2007
·
Yu-Hao Shih
, George KC Huang
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
2
Discover the Used Innovativeness of the Early Adopters
2011
·
Chao-Fu Hong
, Chien-Jen Huang
, et al.
·
Lecture notes in computer science
·
1
The performances of different overlay mark types at 65nm node on 300-mm wafers
2005
·
H. T. Tseng
, Ling-Chieh Lin
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
1
Fast and Accurate in-Line Monitor of Boron Implantation Energy and Dose by Spectroscopic Ellipsometry
2014
·
Tsai-Yu Wen
, Tsuo-Wen Lu
, et al.
·
ECS Transactions
Fast and Accurate in-Line Monitor of Boron Implantation Energy and Dose by Spectroscopic Ellipsometry
2014
·
Tsai-Yu Wen
, Tsuo-Wen Lu
, et al.
·
ECS Meeting Abstracts
Advanced Spectroscopic Ellipsometry Application for Multi-Layers Sige At 28nm Node and Beyond
2013
·
Teng-Chun Hsuan
, Yi-Cheng Hu
, et al.
·
ECS Meeting Abstracts
PDF
Advanced gate CDU control in sub-28nm node using poly slot process by scatterometry metrology
2013
·
Wei-Jhe Tzai
, Howard Chen
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
A novel chance model for building innovation diffusion scenario
2010
·
Chao-Fu Hong
, Hsiao-Fang Yang
, et al.
·
Conference proceedings/Conference proceedings - IEEE International Conference on Systems, Man, and Cybernetics
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Works count:
25
Citation count:
144
H-index:
8
I10-index:
6
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